Showing results: 46 - 60 of 114 items found.
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GX3756 Series -
Marvin Test Solutions, Inc.
The GX3756 is a user configurable, FPGA-based, 3U PXI card which offers 56, TTL I/O signals. The module consists of a daughter card and the GX3700 FPGA baseboard which employs the Altera Stratix III FPGA.
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GX3609 -
Marvin Test Solutions, Inc.
The GX3609 is a 3U PXI FPGA card with 80 TTL differential channels. The GX3609 is comprised of a GX3500 FPGA card and the GX3509, 80 channel, differential TTL expansion card.
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GX3610 -
Marvin Test Solutions, Inc.
The GX3610 is a 3U PXI FPGA card with 80, mLVDS channels. The GX3610 is comprised of the GX3500 PXI FPGA card and the GX3510 expansion card providing 80 mLVDS buffered channels.
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E9902G -
Keysight Technologies
Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Yelo Ltd.
The Yelo Pixi general purpose tester is a PXI based functional test system with in-circuit and continuity capability. Built into a free standing 19” rack is a PXI chassis, mass interconnect fixture interface, PC, flat screen and space for additional user selectable instrumentation.
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Teradyne, Inc.
High-performance VXI and PXI instruments for digital functional test. Teradyne’s Di-Series and eDigital-Series digital test instruments address technologies such as low voltage differential signaling (LVDS), while maintaining full capability to support legacy test requirements. In addition to excellent reliability, these instruments reduce test system footprint, programming and support effort, and overall cost-of-ownership.
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TS-323 -
Terotest Systems Ltd.
The TS-323 GENASYS platform is a PXI based test system which is designed to address a broad range of mil-aero and mission-critical products that require performance functional testing. The GENASYS offers best in class digital test capabilities which can effectively address the test needs associated with legacy ATE systems including the Teradyne L200/L300, GenRad 2750 and VXI-based digital systems.
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LX-OTP2 -
LXinstruments GmbH
The OTP² system platform has recently been available in both the PXI and LXI versions. The OTP2 system platform enables the cost-effective and fast implementation of function test systems based on defined modules and function blocks. Thanks to the open system interfaces, customer-specific adjustments can be made at any time without any problems. When considering options for your next generation functional test system, it is important to assess the entire life cycle of the system and the associated costs and efforts. Use OTP² to accelerate development cycles and reduce the development effort for new functional test systems.
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iTest -
Terotest Systems Ltd.
iTest is primarily a Functional Test platform which is easily configured to test PCB's, complete assemblies or individual devices.In addition, iTest's MDA capability offers the user the opportunity to perform low cost In- Circuit (MDA) testing as well as Combinational testing. Easy integration of 3U & 6U PXI modules, LXI, USB, GPIB and more.
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GX5641 -
Terotest Systems Ltd.
The GX5641 is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), Functional Test, and factory automation applications. The GX5641 consists of 64 bi-directional TTL-differential I/O channels. Each channel has two ports (TTL and differential) and can be individually set to operate in either conversion or static I/O modes.
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GX5641 Series -
Marvin Test Solutions, Inc.
The GX5641 is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), functional test, and factory automation applications. The GX5641 consists of 64 bi-directional TTL-differential I/O channels. Each channel has two ports (TTL and differential) which can be individually set to operate in either conversion or static I/O modes.
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GX5642 -
Terotest Systems Ltd.
The GX5642 is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), Functional Test, and factory automation applications. The GX5642 consists of 64 bi-directional TTL-to-differential LVDS I/O channels. Each channel has two ports (TTL and LVDS) and can be individually set to operate in either conversion or static I/O modes.
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GX5642 -
Marvin Test Solutions, Inc.
The GX5642 is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), Functional Test, and factory automation applications. The GX5642 consists of 64 bi-directional TTL-to-differential LVDS I/O channels. Each channel has two ports (TTL and LVDS) and can be individually set to operate in either conversion or static I/O modes.
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GC5050 -
Terotest Systems Ltd.
The GC5050 is a high speed Dynamic Digital I/O card that provides capabilities comparable to high speed I/O products found in large functional test systems. The card shares an identical architecture with the GX5050, a 6U PXI card. Both have the ability to operate independently of the host computer when in the RUN mode.
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WinTek s.a.s.
System PC Based particularly suitable for vibration and noise measurements for the characterization of mechanical, electromechanical and electroacoustic and for the control and monitoring of installations of production. Complete configurability for the use of platforms PC (Notebook, desktop, PXI) suitable to applications of both static labotatorio, both dynamic (eg road-test) and also in the production line (functional tests and monitoring).